Your selections:
High performance raster scanning of atomic force microscopy using Model-free Repetitive Control
- Li, Linlin, Fleming, Andrew J., Yong, Yuen K., Aphale, Sumeet S., Zhu, LiMin
Reducing cross-coupling in a compliant XY nanopositioner for fast and accurate raster scanning
- Yong, Yuen Kuan, Liu, Kexiu, Moheimani, S. O. Reza
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